Dynamic Rdson Test Station for FTI 1000

      COMPANY DESCRIPTION

    Focused Test designs, manufactures and supports a family of power discrete and analog IC ATE (Automatic Test Equipment) to offer targeted test solutions for lowest acquisition price and highest throughput.

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    Power Discrete Device Tester.

    Independent test channel, AC and DC parameter test integrated MOSFET test system

    Open, programmable operating platform, and powerful data analysis, chart drawing tools

    Flexible and compatible with wafer probe stations or gravity test sorters